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Optical Engineering

Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs
Author(s): Denis V. Sutyrin; Nicola Poli; Nicolò Beverini; Guglielmo M. Tino
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Paper Abstract

We experimentally study two Ti:sapphire optical frequency comb femtosecond regimes, respectively, with a linear and a nonlinear dependence of the carrier-envelope offset frequency (fCEO) on pump intensity. For both regimes, we study the effect of single- and multimode pump lasers on the fCEO phase noise. We demonstrate that the femtosecond regime is playing a more important role on the fCEO phase noise and stability than the pump laser type.

Paper Details

Date Published: 14 July 2014
PDF: 5 pages
Opt. Eng. 53(12) 122603 doi: 10.1117/1.OE.53.12.122603
Published in: Optical Engineering Volume 53, Issue 12
Show Author Affiliations
Denis V. Sutyrin, Univ. degli Studi di Firenze (Italy)
Nicola Poli, Univ. degli Studi di Firenze (Italy)
Nicolò Beverini, Univ. di Pisa (Italy)
Guglielmo M. Tino, Univ. degli Studi di Firenze (Italy)

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