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Optical Engineering

Measurement of dynamic interferometer baseline perturbations by means of wavelength-scanning interferometry
Author(s): Nikolai Ushakov; Leonid Liokumovich
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Paper Abstract

An approach for measuring fast oscillations of an absolute value of interferometer optical path difference (OPD) has been developed. The principles of frequency-scanning interferometry are utilized for the registration of the interferometer spectral function from which the OPD is calculated. The proposed approach enables one to capture the absolute baseline variations at frequencies much higher than the spectral acquisition rate. Despite the conventional approaches associating a single baseline indication to the registered spectrum, in the proposed method, a specially developed demodulation procedure is applied to the spectrum. This provides the ability to capture the baseline variations that took place during the spectrum acquisition. An analytical model describing the limitations on the parameters of the possibly registered baseline variations is developed. The experimental verification of the proposed approach and the developed model has been performed.

Paper Details

Date Published: 12 November 2014
PDF: 6 pages
Opt. Eng. 53(11) 114103 doi: 10.1117/1.OE.53.11.114103
Published in: Optical Engineering Volume 53, Issue 11
Show Author Affiliations
Nikolai Ushakov, Saint-Petersburg State Polytechnical Univ. (Russia)
Leonid Liokumovich, Saint-Petersburg State Polytechnical Univ. (Russia)

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