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Optical Engineering

Statistical patterns: an approach for high-speed and high-accuracy shape measurements
Author(s): Martin Schaffer; Marcus Große; Bastian Harendt; Richard Kowarschik
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Paper Abstract

Statistical patterns have been used for structured illumination within a stereo-photogrammetry setup to precisely measure the shape of nearly arbitrary objects in a short time. This contribution gives an overview of recently developed projection setups based on such statistical patterns. Coherent and incoherent approaches as well as the applied reconstruction algorithm are explained. The results show the suitability of the statistical pattern projection approach to replace the commonly used slow digital light processing (DLP) projectors of three-dimensional shape sensors and facilitate measurements in an ultrashort time frame (microsecond range), e.g., to track moving objects.

Paper Details

Date Published: 29 April 2014
PDF: 9 pages
Opt. Eng. 53(11) 112205 doi: 10.1117/1.OE.53.11.112205
Published in: Optical Engineering Volume 53, Issue 11
Show Author Affiliations
Martin Schaffer, Friedrich-Schiller-Univ. Jena (Germany)
Marcus Große, Friedrich-Schiller-Univ. Jena (Germany)
Bastian Harendt, Friedrich-Schiller-Univ. Jena (Germany)
Richard Kowarschik, Friedrich-Schiller-Univ. Jena (Germany)


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