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Optical Engineering • Open Access

Dynamic temperature field measurements using a polarization phase-shifting technique

Paper Abstract

In this study, an optical system capable of simultaneously grabbing three phase-shifted interferometric images was developed for dynamic temperature field measurements of a thin flame. The polarization phase-shifting technique and a Michelson interferometer that is coupled to a 4-f system with a Ronchi grating placed at the frequency plane are used. This configuration permits the phase-shifted interferograms to be grabbed simultaneously by one CCD. The temperature field measurement is based on measuring the refraction index difference by solving the inverse Abel transform, which requires information obtained by the fringe order localization. The phase map is retrieved by a three-step algorithm. Experimental results of a dynamic thin flame are presented.

Paper Details

Date Published: 28 February 2014
PDF: 5 pages
Opt. Eng. 53(11) 112202 doi: 10.1117/1.OE.53.11.112202
Published in: Optical Engineering Volume 53, Issue 11
Show Author Affiliations
David Ignacio Serrano-García, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Amalia Martínez-García, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Noel-Ivan Toto-Arellano, Univ. Tecnológica de Tulancingo (Mexico)
Yukitoshi Otani, Utsunomiya Univ. (Japan)

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