Share Email Print
cover

Optical Engineering

DeitY-TU face database: its design, multiple camera capturing, characteristics, and evaluation
Author(s): Mrinal Kanti Bhowmik; Kankan Saha; Priya Saha; Debotosh Bhattacharjee
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

The development of the latest face databases is providing researchers different and realistic problems that play an important role in the development of efficient algorithms for solving the difficulties during automatic recognition of human faces. This paper presents the creation of a new visual face database, named the Department of Electronics and Information Technology-Tripura University (DeitY-TU) face database. It contains face images of 524 persons belonging to different nontribes and Mongolian tribes of north-east India, with their anthropometric measurements for identification. Database images are captured within a room with controlled variations in illumination, expression, and pose along with variability in age, gender, accessories, make-up, and partial occlusion. Each image contains the combined primary challenges of face recognition, i.e., illumination, expression, and pose. This database also represents some new features: soft biometric traits such as mole, freckle, scar, etc., and facial anthropometric variations that may be helpful for researchers for biometric recognition. It also gives an equivalent study of the existing two-dimensional face image databases. The database has been tested using two baseline algorithms: linear discriminant analysis and principal component analysis, which may be used by other researchers as the control algorithm performance score.

Paper Details

Date Published: 20 June 2014
PDF: 24 pages
Opt. Eng. 53(10) 102106 doi: 10.1117/1.OE.53.10.102106
Published in: Optical Engineering Volume 53, Issue 10
Show Author Affiliations
Mrinal Kanti Bhowmik, Tripura Univ. (India)
Kankan Saha, Tripura Univ. (India)
Priya Saha, Tripura Univ. (India)
Debotosh Bhattacharjee, Jadavpur Univ. (India)


© SPIE. Terms of Use
Back to Top