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Optical Engineering

Short wavelength and polarized phase shifting fringe projection imaging of translucent objects
Author(s): Rongguang Liang
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Paper Abstract

Measuring surface topography of translucent objects with phase shifting fringe projection method is a challenge because of the reduced fringe contrast due to the scattering inside the object. The internal structure also has an impact to the measurement. We present a new phase shifting fringe project imaging method to measure three-dimensional surface shapes of translucent objects. This method employs polarized short wavelength to increase the fringe contrast by reducing the internal scattered light from reaching the camera.

Paper Details

Date Published: 21 January 2014
PDF: 6 pages
Opt. Eng. 53(1) 014104 doi: 10.1117/1.OE.53.1.014104
Published in: Optical Engineering Volume 53, Issue 1
Show Author Affiliations
Rongguang Liang, College of Optical Sciences, The Univ. of Arizona (United States)


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