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Optical Engineering • Open Access

Developing signal processing method for recognizing defects in metal samples based on heat diffusion properties in sonic infrared image sequences
Author(s): Zhi Zeng; Ning Tao; Lichun Feng; Cunlin Zhang; Xiaoyan Han

Paper Abstract

In sonic infrared (SonicIR) imaging, heat is generated in defect areas during the sonic pulse; the heat appears bright in SonicIR images as the indication of a defect. However, in practical applications of SonicIR, there are lots of disturbing bright areas in infrared images, such as heat reflection and paint problem. When crack size is small, the generated heat appears not bright enough to be recognizable. Based on heat diffusion properties in the one-dimensional temporal and two-dimensional spatial domain, a method is developed to automatically recognize defect signals from SonicIR image sequences. The algorithm is verified with the SonicIR image sequences of 100 metal plates which may have different thickness, materials, or crack sizes.

Paper Details

Date Published: 31 January 2013
PDF: 7 pages
Opt. Eng. 52(6) 061309 doi: 10.1117/1.OE.52.6.061309
Published in: Optical Engineering Volume 52, Issue 6
Show Author Affiliations
Zhi Zeng, Chongqing Normal Univ. (China)
Ning Tao, Capital Normal Univ. (China)
Lichun Feng, Capital Normal Univ. (China)
Cunlin Zhang, Capital Normal Univ. (China)
Xiaoyan Han, Wayne State Univ. (United States)

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