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Optical Engineering

Single orthogonal sinusoidal grating for gamma correction in digital projection phase measuring profilometry
Author(s): Yanshan Xiao; Yiping Cao; Yingchun Wu; Shunping Shi
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Paper Abstract

The gamma nonlinearity of the digital projector leads to obvious phase errors in the phase measuring profilometry. Based on the Fourier spectrum analysis of the captured pattern, a robust gamma correction method is proposed in this paper. An orthogonal sinusoidal grating precoded with two different known gamma values is used to evaluate the gamma value of the pattern. The evaluated gamma value is then encoded into the computer-generated phase-shifting fringe patterns before the fringe patterns are sent to the digital projector, which makes the captured fringe patterns well-sinusoidal and alleviates the phase errors caused by the gamma nonlinearity. Compared with other gamma correction methods, only one captured pattern is needed to evaluate the gamma value without loss of the accuracy. With the proposed method, a fast and accurate three-dimensional shape measurement can be achieved using the conventional three-step phase-shifting algorithm. Experiments have verified its feasibility and validity.

Paper Details

Date Published: 7 May 2013
PDF: 8 pages
Opt. Eng. 52(5) 053605 doi: 10.1117/1.OE.52.5.053605
Published in: Optical Engineering Volume 52, Issue 5
Show Author Affiliations
Yanshan Xiao, Sichuan Univ. (China)
Yiping Cao, Sichuan Univ. (China)
Yingchun Wu
Shunping Shi, Sichuan Univ. (China)

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