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Optical Engineering

Reconstruction of optical images of graphene-based materials coated on dielectric substrates
Author(s): Inhwa Jung; Yong Joo Ra; Jong Yeog Son; Yong Tae Kang; Kyong-Yop Rhee
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Paper Abstract

The colors of thin and thick layers of graphene and graphene oxide films on either SiO 2 or Si 3 N 4 grown silicon substrates were generated by a theoretical calculation procedure. The effects of the thicknesses of the material and the dielectric layers on the visibility of the graphene-based materials were investigated. The theoretical investigation was supplemented by measurements of the thicknesses of the material layers using either an atomic force microscope or a profilometer, depending on the thickness range. By combining the color calculation procedure with the measured thickness profiles, optical images of graphene-based materials on dielectric substrates can be reconstructed. The reconstructed image corresponds well to the real microscope image, which suggests that the image reconstruction procedure is a convenient way to investigate colors and determine the thickness of graphene-based materials.

Paper Details

Date Published: 1 February 2013
PDF: 8 pages
Opt. Eng. 52(2) 023601 doi: 10.1117/1.OE.52.2.023601
Published in: Optical Engineering Volume 52, Issue 2
Show Author Affiliations
Inhwa Jung, Kyung Hee Univ. (Korea, Republic of)
Yong Joo Ra, Kyung Hee Univ. (Korea, Republic of)
Jong Yeog Son, Kyung Hee Univ. (Korea, Republic of)
Yong Tae Kang, Kyung Hee Univ. (Korea, Republic of)
Kyong-Yop Rhee, Kyung Hee Univ. (Korea, Republic of)


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