Share Email Print

Optical Engineering

One-dimensional gradient-index metrology based on ray slope measurements using a bootstrap algorithm
Author(s): Di Lin; James R. Leger; Mint Kunkel; Peter McCarthy
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The refractive index profile of one-dimensional gradient-index (GRIN) samples can be measured using the incident and exit beam angles of multiple beams passing through the sample at different positions along the index gradient. Beginning from a region of known refractive index, the collective angular deflection measurement of multiple beams is bootstrapped to compute the index profile of the entire sample. An alternative method using an approximate beam displacement model and a corrective algorithm is also presented. The two techniques are used to measure the index profile of a thick GRIN sample, and experimental results show good agreement with a maximum discrepancy of 1.5×10 [sup]−3 in the calculated index. An index accuracy of 5×10 −4 is predicted for the bootstrap method employing typical micron-level spatial measurements.

Paper Details

Date Published: 16 July 2013
PDF: 11 pages
Opt. Eng. 52(11) 112108 doi: 10.1117/1.OE.52.11.112108
Published in: Optical Engineering Volume 52, Issue 11
Show Author Affiliations
Di Lin, Univ. of Minnesota, Twin Cities (United States)
James R. Leger, Univ. of Minnesota, Twin Cities (United States)
Mint Kunkel, Univ. of Minnesota, Twin Cities (United States)
Peter McCarthy, Univ. of Rochester (United States)

© SPIE. Terms of Use
Back to Top