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Optical Engineering • Open Access

Proton radiation damage effects on the response of high speed communication avalanche photodiodes (notice of removal)
Author(s): Ahmed Nabih Zaki Rashed; Mohamed M. E. El-Halawany

Paper Abstract

Subsequent to its publication in Optical Engineering, SPIE learned that a significant portion of this paper was previously published as “Harmful Proton Radiation Damage and Induced Bit Error Effects on the Performance of Avalanche Photodiode Devices,” in International Journal of Multidisciplinary Sciences and Engineering, Vol. 2, No. 4 (July 2011). Double publication violates SPIE Code of Ethics and consequently the paper has been removed from Optical Engineering by the publisher. The Authors

Paper Details

Date Published: 7 January 2013
PDF: 2 pages
Opt. Eng. 52(1) 014003 doi: 10.1117/1.OE.52.1.014003
Published in: Optical Engineering Volume 52, Issue 1
Show Author Affiliations
Ahmed Nabih Zaki Rashed, Menoufia Univ. (Egypt)
Mohamed M. E. El-Halawany, Menoufia Univ. (Egypt)


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