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Optical Engineering

Compressive passive millimeter wave imaging with extended depth of field
Author(s): Vishal M. Patel; Joseph N. Mait
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Paper Abstract

We introduce a millimeter wave imaging modality with extended depth-of-field that provides diffraction-limited images with reduced-spatial sampling. The technique uses a cubic phase element in the pupil of the system and a nonlinear recovery algorithm to produce images that are insensitive to object distance. We present experimental results that validate system performance and demonstrate a greater than four-fold increase in depth-of-field with a reduction in sampling requirements by a factor of at least two.

Paper Details

Date Published: 11 June 2012
PDF: 8 pages
Opt. Eng. 51(9) 091610 doi: 10.1117/1.OE.51.9.091610
Published in: Optical Engineering Volume 51, Issue 9
Show Author Affiliations
Vishal M. Patel, Univ. of Maryland, College Park (United States)
Joseph N. Mait, U.S. Army Research Lab. (United States)

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