Share Email Print
cover

Optical Engineering

Estimation of the convergence order of rigorous coupled-wave analysis for binary gratings in optical critical dimension metrology
Author(s): Shiyuan Liu; Yuan Ma; Xiuguo Chen; Chuanwei Zhang
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In most cases of optical critical dimension metrology, when applying rigorous coupled-wave analysis to optical modeling, a high order of Fourier harmonics is usually set up to guarantee the convergence of the final results. However, the total number of floating point operations grows dramatically as the truncation order increases. Therefore, it is critical to choose an appropriate order to obtain high computational efficiency without losing much accuracy in the meantime. We show that the convergence order associated with the structural and optical parameters is estimated through simulation. The results indicate that the convergence order is linear with the period of the sample when fixing the other parameters, both for planar diffraction and conical diffraction. The illuminated wavelength also affects the convergence of a final result. With further investigations concentrated on the ratio of illuminated wavelength to period, it is discovered that the convergence order decreases with the growth of the ratio, and when the ratio is fixed, convergence order jumps slightly, especially in a specific range of wavelength. This characteristic could be applied to estimate the optimum convergence order of given samples to obtain high computational efficiency.

Paper Details

Date Published: 16 May 2012
PDF: 8 pages
Opt. Eng. 51(8) 081504 doi: 10.1117/1.OE.51.8.081504
Published in: Optical Engineering Volume 51, Issue 8
Show Author Affiliations
Shiyuan Liu, Huazhong Univ. of Science and Technology (China)
Yuan Ma, Huazhong Univ. of Science and Technology (China)
Xiuguo Chen, Huazhong Univ. of Science and Technology (China)
Chuanwei Zhang, Huazhong Univ. of Science and Technology (China)


© SPIE. Terms of Use
Back to Top