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Optical Engineering

Measurement and contouring of micro-scale objects through integrated transillumination in a flexible fiber probe system
Author(s): Valiyambath K. Mohankumar; Krishnan Sathiyamoorthy; Vadakke M. Murukeshan
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Paper Abstract

High-resolution measurement and contouring of objects with micro-scale sizes have been two of the research challenges in many areas, such as nondestructive testing and imaging, imaging of artifacts in MEMS, and lab-on-chip devices, as well as in biomedical imaging. In this context, we use a transillumination incorporated fiber probe imaging system to enable imaging of the targeted object in a single shot. It also enables positioning of the probe system to the region of interest for further fine analysis, thereby reducing the long scanning time faced by conventional approaches. The capability of the developed probe is illustrated using standard USAF resolution chart and fluorescent microspheres as test targets. The probe system has axial and lateral resolutions of about 16 μm and 144  lp/mm, respectively. This proposed probe scheme can potentially be employed as a viable diagnostic imaging methodology.

Paper Details

Date Published: 6 July 2012
PDF: 6 pages
Opt. Eng. 51(7) 073602 doi: 10.1117/1.OE.51.7.073602
Published in: Optical Engineering Volume 51, Issue 7
Show Author Affiliations
Valiyambath K. Mohankumar, Nanyang Technological Univ. (Singapore)
Krishnan Sathiyamoorthy, Nanyang Technological Univ. (Singapore)
Vadakke M. Murukeshan, Nanyang Technological Univ. (Singapore)

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