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Optical Engineering • Open Access

Adjustable-window grating interferometer based on a Mach-Zehnder configuration for phase profile measurements of transparent samples
Author(s): David-Ignacio Serrano-García; Amalia Martínez-García; Juan-Antonio Rayas-Alvarez; Noel I. Toto Arellano; Gustavo Rodriguez-Zurita; Areli Montes Pérez

Paper Abstract

This communication describes some details of polarization modulation that are useful in phase-shifting interferometry when applied to phase profile measurements of phase objects. Since non-destructive optical techniques allow surface measurement with high accuracy, a Mach-Zehnder configuration coupled to a 4-f arrangement using phase gratings placed on the Fourier plane was implemented to analyze phase objects. Each beam of the interferometer goes through a birefringent wave plate in order to achieve nearly circular polarization of opposite rotations, with respect to each other. The interference of the fields associated with replicated beams, centered on each diffraction order, is achieved varying the spacing of windows with respect to the grating period. Experimental results are presented for cases of four and nine simultaneously captured interferograms.

Paper Details

Date Published: 4 May 2012
PDF: 8 pages
Opt. Eng. 51(5) 055601 doi: 10.1117/1.OE.51.5.055601
Published in: Optical Engineering Volume 51, Issue 5
Show Author Affiliations
David-Ignacio Serrano-García, Centro de Investigaciones en Óptica, A.C. (Mexico)
Amalia Martínez-García, Centro de Investigaciones en Óptica, A.C. (Mexico)
Juan-Antonio Rayas-Alvarez, Centro de Investigaciones en Óptica, A.C. (Mexico)
Noel I. Toto Arellano, Univ. Politécnica de Tulancingo (Mexico)
Gustavo Rodriguez-Zurita, Benemérita Univ. Autónoma de Puebla (Mexico)
Areli Montes Pérez, Benemérita Univ. Autónoma de Puebla (Mexico)

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