Share Email Print
cover

Optical Engineering

Accuracy of the reflectance spectrum recovery in a light-emitting diode-based multispectral imaging system
Author(s): Laure Fauch; Ervin Nippolainen; Alexei A. Kamshilin
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

We present a study of parameters that affect the accuracy of a reflectance spectrum recovery from the compressed data obtained in a multispectral imaging (MSI) system consisting of a computer-controlled set of light-emitting diodes (LEDs) synchronously switched with a digital monochrome camera. The system allows recovery of a two-dimensional distribution of reflection spectra in a wide spectral range (400 to 700 nm) just from a few captured frames. It is shown that the MSI system designed and assembled by students in a University laboratory is capable of measuring of absolute values of smooth reflectance spectra with an error smaller than 3%. Further, the increasing of the system accuracy could be achieved by providing higher spatial uniformity and higher overlapping of object illumination by all the LEDs.

Paper Details

Date Published: 4 May 2012
PDF: 8 pages
Opt. Eng. 51(5) 053201 doi: 10.1117/1.OE.51.5.053201
Published in: Optical Engineering Volume 51, Issue 5
Show Author Affiliations
Laure Fauch, Univ. of Eastern Finland (Finland)
Ervin Nippolainen, Univ. of Eastern Finland (Finland)
Alexei A. Kamshilin, Univ. of Eastern Finland (Finland)


© SPIE. Terms of Use
Back to Top