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Optical Engineering • Open Access

Negative refraction via radiative surface phonon polaritons in a silicon carbide-based multilayer structure
Author(s): Olalekan S. Adewuyi; James S. Hammonds

Paper Abstract

In this letter, we predict that radiative surface phonon polariton (RSPhP) modes, in a multilayer structure consisting of thin-film silicon carbide (SiC) bounded by silicon (Si) and diamond (Di), can be used to achieve negative refraction of mid-infrared light at approximately 11 μm. Dispersion relations, calculated for the Si/SiC/Di structure, show that the RSPhP mode exhibits negative dispersion and couples with incident light. Poynting vector calculations show how the energy flux may be refracted, negatively, in the SiC layer.

Paper Details

Date Published: 4 December 2012
PDF: 3 pages
Opt. Eng. 51(12) 120502 doi: 10.1117/1.OE.51.12.120502
Published in: Optical Engineering Volume 51, Issue 12
Show Author Affiliations
Olalekan S. Adewuyi, Howard Univ. (United States)
James S. Hammonds, Howard Univ. (United States)

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