Share Email Print

Optical Engineering

Fourier transform profilometry using a binary area modulation technique
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

A recent study found that it is very difficult to use the squared binary defocusing technique to eliminate the influence of third-order harmonics without compromising fringe quality, and thus it is challenging to utilize Fourier transform profilometry to achieve high-quality three-dimensional measurement. A novel approach is presented to effectively eliminate the third-order harmonics by modulating the squared binary structured patterns. Both simulation and experiments are presented to verify the performance of the proposed technique.

Paper Details

Date Published: 2 November 2012
PDF: 6 pages
Opt. Eng. 51(11) 113602 doi: 10.1117/1.OE.51.11.113602
Published in: Optical Engineering Volume 51, Issue 11
Show Author Affiliations
William Lohry, Iowa State Univ. (United States)
Song Zhang, Iowa State Univ. (United States)

© SPIE. Terms of Use
Back to Top