Share Email Print

Optical Engineering

Influence of readout process on presampled modulation transfer function in computed radiography system
Author(s): Yasuyuki Kawaji; Fukai Toyofuku; Tadamitsu Ideguchi; Yoshiharu Higashida
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In a computed radiography (CR) system, there are a number of different mechanisms that cause blurring. The aim of this study was to analyze intrinsic system factors of CR systems that could affect the modulation transfer function (MTF), such as afterglow during readout and the anti-alias filter before analog to digital converter. Methods and Materials: Mathematical slit and edge images were generated from analytical functions. These images were arranged perpendicularly to the laser scan and the plate scan directions, respectively. The influence of afterglow and the anti-alias filter was simulated by using Microsoft Excel. The MTF values calculated from those simulation images were compared with the theoretical MTF values obtained analytically. Results: MTF values in the laser scan direction measured with the slit and edge methods were significantly lower than MTF values in the plate scan direction. The degree of influence on MTF with respect to afterglow and the anti-alias filters was different depending on the measurement method and the scan directions of CR systems. The influence of the anti-alias filters mainly contributed to the differences between MTF values with the slit and edge methods in the laser scan direction.

Paper Details

Date Published: 1 November 2012
PDF: 9 pages
Opt. Eng. 51(11) 113202 doi: 10.1117/1.OE.51.11.113202
Published in: Optical Engineering Volume 51, Issue 11
Show Author Affiliations
Yasuyuki Kawaji, Junshin Gakuen Univ. (Japan)
Fukai Toyofuku, Kyushu Univ. (Japan)
Tadamitsu Ideguchi, Junshin Gakuen Univ. (Japan)
Yoshiharu Higashida, Kyushu Univ. (Japan)

© SPIE. Terms of Use
Back to Top