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Optical Engineering

Noise sources in imaging static Fourier transform spectrometers
Author(s): Yann Ferrec; Christophe Coudrain; Jérôme Primot; Noura Ayari-Matallah; Pierre H. Chavel; François Goudail; Hervé Sauer; Jean Taboury; Jean-Claude L. Fontanella
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Paper Abstract

Imaging static Fourier transform spectrometers are well-adapted instruments for remote sensing. However, the path from the raw images to the spectral images is quite long, thus multiplying the potential noise sources. In this article, we propose to review these perturbation sources. We first recall how detector or photon noise on the interferogram affects the estimated spectrum. Then, we focus on inhomogeneities of the focal plane array. Although these inhomogeneities are deterministic, they generate noise when they are ill-corrected. Finally, we describe defects due to errors that may occur during the image processing step. We also give some avenues to limit the impact of these noises.

Paper Details

Date Published: 19 July 2012
PDF: 11 pages
Opt. Eng. 51(11) 111716 doi: 10.1117/1.OE.51.11.111716
Published in: Optical Engineering Volume 51, Issue 11
Show Author Affiliations
Yann Ferrec, ONERA (France)
Christophe Coudrain, ONERA (France)
Jérôme Primot, ONERA (France)
Noura Ayari-Matallah, Institut d'Optique Graduate School (France)
Pierre H. Chavel, Institut d'Optique Graduate School (France)
François Goudail, Institut d'Optique Graduate School (France)
Hervé Sauer, Institut d'Optique Graduate School (France)
Jean Taboury, Institut d'Optique Graduate School (France)
Jean-Claude L. Fontanella, Thales Optronique S.A.S. (France)


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