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Optical Engineering • Open Access

Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems

Paper Abstract

The snapshot advantage is a large increase in light collection efficiency available to high-dimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality.

Paper Details

Date Published: 13 June 2012
PDF: 8 pages
Opt. Eng. 51(11) 111702 doi: 10.1117/1.OE.51.11.111702
Published in: Optical Engineering Volume 51, Issue 11
Show Author Affiliations
Nathan A. Hagen, Rice Univ. (United States)
Liang S. Gao, Rice Univ. (United States)
Tomasz S. Tkaczyk, Rice Univ. (United States)
Robert T. Kester, Rebellion Photonics (United States)

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