Share Email Print

Optical Engineering

Binary coded linear fringes for three-dimensional shape profiling
Author(s): Gastón A. Ayubi; J. Matías Di Martino; Jorge L. Flores; José A. Ferrari
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a three-dimensional (3-D) shape profiling method that involves the projection of two shifted strictly binary (square wave) fringe patterns, whose adequately weighted average allows to synthesize a sawtooth pattern. We demonstrate that the deformed fringes (after unwrapping) provide an intensity pattern proportional to the depth profile of the surface. The proposed technique overcomes the nonlinear response (i.e., the "gamma problem") of digital cameras and commercial video projectors without previous calibration. The two binary patterns can be encoded in the color components of a single color image, which allows a reliable 3-D profiling surface reconstruction at large time-rates. Validation experiments are presented.

Paper Details

Date Published: 1 October 2012
PDF: 6 pages
Opt. Eng. 51(10) 103601 doi: 10.1117/1.OE.51.10.103601
Published in: Optical Engineering Volume 51, Issue 10
Show Author Affiliations
Gastón A. Ayubi, Univ. de la República (Uruguay)
J. Matías Di Martino, Univ. de la República (Uruguay)
Jorge L. Flores, Univ. de Guadalajara (Mexico)
José A. Ferrari, Univ. de la República (Uruguay)

© SPIE. Terms of Use
Back to Top