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Optical Engineering

High-throughput and multislit imaging spectrograph for extended sources
Author(s): Supriya Chakrabarti; Olli-Pekka Jokiaho; Jeffrey L. Baumgardner; Timothy A. Cook; Jason Martel; Marina Galand
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Paper Abstract

We describe a high-throughput (5×10-4cm2 sr) imaging spectrograph that uses an echelle grating operating at a high dispersion order (24 to 43) to observe extended sources such as atmospheric airglow and diffuse proton aurora at high spectral resolution (approximately 0.02 nm). Instead of using a traditional single slit, the implementation of the instrument described here uses four (50 µm × 25 mm) slits through which the radiation enters the spectrograph. The field of view is selected using appropriate foreoptics: the present implementation is a long, narrow configuration of 0.1 × 50 deg. By placing interference filters in the beam path, the instrument can simultaneously observe several spectral features located anywhere in the visible band (approximately 300 to 1000 nm) at high resolution. This design allows a single echelle grating and a single detector (a CCD in the present implementation) to view the same scene. The design is flexible; the number of slits and the slit dimensions can be tailored to the trade-offs between resolution, throughput, and number of spectral features depending upon the measurement need. While the implementation described here covers only the visible range, the use of different combinations of detector and filter sets can extend its operation to other wavelength regions.

Paper Details

Date Published: 1 February 2012
PDF: 7 pages
Opt. Eng. 51(1) 013003 doi: 10.1117/1.OE.51.1.013003
Published in: Optical Engineering Volume 51, Issue 1
Show Author Affiliations
Supriya Chakrabarti, Boston Univ. (United States)
Olli-Pekka Jokiaho, Boston Univ. (United States)
Jeffrey L. Baumgardner, Boston Univ. (United States)
Timothy A. Cook, Boston Univ. (United States)
Jason Martel, Boston Univ. (United States)
Marina Galand, Imperial College London (United Kingdom)

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