Share Email Print
cover

Journal of Applied Remote Sensing

New building signature extraction method from single very high-resolution synthetic aperture radar images based on symmetric analysis
Author(s): Ping-ping Lu; Kang-ning Du; Wei-dong Yu; Hong Feng
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

To monitor urban areas using a synthetic aperture radar (SAR) sensor, we propose a symmetric analysis-based building signature extraction method. Instead of using separated algorithms, a unified framework is proposed to extract both layover and shadow areas. Since these two primitives usually exhibit long strip patterns in very-high-resolution SAR images, symmetry axes are first delineated. After that, local features are extracted from both symmetry and range direction to better distinguish different primitives. Then, these local radiometric features are used to identify different categories (layover, shadow, and background) via an efficient multiclass logistic regression classifier. To discriminate individual primitives, geometric information is adopted via an improved Ramer Douglas Peucker algorithm, which also simplifies the parameters for describing these primitives. To further enhance accuracy, combinatory analysis is implemented to exclude some false detections, and then shadow areas are extended via a local region growing method. The proposed approach is tested on a 0.75-m resolution airborne C band SAR image. The experiments are carried out under both small- and large-scale scenes, and the comparative results show our method has some advantages in low-contrast target detection and false-alarm elimination.

Paper Details

Date Published: 2 July 2015
PDF: 14 pages
J. Appl. Remote Sens. 9(1) 095072 doi: 10.1117/1.JRS.9.095072
Published in: Journal of Applied Remote Sensing Volume 9, Issue 1
Show Author Affiliations
Ping-ping Lu, Institute of Electronics (China)
Univ. of the Chinese Academy of Sciences (China)
Kang-ning Du, Institute of Electronics (China)
Univ. of the Chinese Academy of Sciences (China)
Wei-dong Yu, Institute of Electronics (China)
Hong Feng, Institute of Electronics (China)
Univ. of the Chinese Academy of Sciences (China)


© SPIE. Terms of Use
Back to Top