Share Email Print
cover

Journal of Applied Remote Sensing

Quantitative analysis of relative geolocation accuracy of the TerraSAR-X enhanced ellipsoid corrected product
Author(s): Takashi Nonaka; Tomohito Asaka; Keishi Iwashita; Wen Liu; Fumio Yamazaki; Tadashi Sasagawa
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

High-resolution commercial synthetic aperture radar (SAR) satellites with resolutions of several meters have recently been used for effective disaster monitoring. One study reported the earthquake’s displacement using the pixel matching method with both pre- and postevent TerraSAR-X data, with a validated accuracy of ∼30  cm at global navigation satellite system (GNSS) Earth observation network (GEONET) reference points. However, it is insufficient to determine the accuracy using analysis of only a couple of data points per orbit. In addition, the errors were not reported because the number of data samples was too small to discuss the statistics. In order to better understand displacement accuracy, we analyzed displacement features using the pixel matching method to evaluate the relative geolocation accuracies of the TerraSAR-X product. First, we used fast Fourier transform oversampling 16 times to develop the pixel matching method for estimating the displacement at the subpixel level using the TerraSAR-X StripMap dataset. Second, we applied this methodology to 20 pairs of images from the Tokyo metropolitan area and calculated the displacement for each image pair. Third, we conducted spatial and temporal analyses in order to understand the displacement features. Finally, we evaluated the displacement accuracy by comparison with GEONET and solid earth tide data as a reference.

Paper Details

Date Published: 4 October 2017
PDF: 11 pages
J. Appl. Rem. Sens. 11(4) 044001 doi: 10.1117/1.JRS.11.044001
Published in: Journal of Applied Remote Sensing Volume 11, Issue 4
Show Author Affiliations
Takashi Nonaka, Nihon Univ. (Japan)
Tomohito Asaka, Nihon Univ. (Japan)
Keishi Iwashita, Nihon Univ. (Japan)
Wen Liu, Chiba Univ. (Japan)
Fumio Yamazaki, Chiba Univ. (Japan)
Tadashi Sasagawa, PASCO Corp. (Japan)


© SPIE. Terms of Use
Back to Top