Share Email Print
cover

Journal of Applied Remote Sensing • Open Access

Polarimetric analysis of radar backscatter from ground-based scatterometers and wheat biomass monitoring with advanced synthetic aperture radar images
Author(s): Lei He; Ling Tong; Yuxia Li; Yan Chen; Longfei Tan; Caizheng Guo

Paper Abstract

This article presents an analysis of the scattering measurements for an entire wheat growth cycle by ground-based scatterometers at a frequency of 5.3 GHz. Since wheat ears are related to wheat growth and yield, the radar backscatter of wheat was analyzed at two different periods, i.e., with and without wheat ears. Simultaneously, parameters such as wheat and soil characteristics as well as volume scattering and soil scattering were analyzed for the two periods during the entire growth cycle. Wheat ears have been demonstrated to have a great influence on radar backscatter; therefore, a modified version of water-cloud model used for retrieving biomass should consider the effect of wheat ears. This work presents two retrieval models based on the water-cloud model and adopts the advanced integral equation model to simulate the soil backscatter before the heading stage and the backscatter from the layer under wheat ears after the heading stage. The research results showed that the biomass retrieved from the advanced synthetic aperture radar (ASAR) images to agree well with the data measured <italic<in situ</italic< after setting the modified water-cloud model for the growth stages with ears. Furthermore, it was concluded that wheat ears should form an essential component of theoretical modeling as they influence the final yield.

Paper Details

Date Published: 21 April 2016
PDF: 13 pages
J. Appl. Remote Sens. 10(2) 026008 doi: 10.1117/1.JRS.10.026008
Published in: Journal of Applied Remote Sensing Volume 10, Issue 2
Show Author Affiliations
Lei He, Univ. of Electronic Science and Technology of China (China)
Ling Tong, Univ. of Electronic Science and Technology of China (China)
Yuxia Li, Univ. of Electronic Science and Technology of China (China)
Yan Chen, Univ. of Electronic Science and Technology of China (China)
Longfei Tan, Univ. of Electronic Science and Technology of China (China)
Caizheng Guo, Univ. of Electronic Science and Technology of China (China)


© SPIE. Terms of Use
Back to Top