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Journal of Nanophotonics

Differential cross section for reflected electrons measured by electron mirror method
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Paper Abstract

We derive an equation for the differential cross-section dσ/dΩ of reflected electrons by using Electron Mirror method. The mathematical derivation of differential cross-section equation is based on the Rutherford scattering model as well as the equation of electric potential difference. We describe the interaction of focused electron beams with a polyethylene terephthalate sample using focused ion beam-scanning electron microscope electron mirror image. The electron differential cross-section dσ/dΩ for different working distances h=33, 20, and 10 mm, with a scattering angle θ ranged from 10 deg to 55 deg, incident electrons energies η=500, 750, and 1000 eV, and scanning potential Δφ ranged from 1 to 2 kV has been calculated. According to our findings, the differential cross-section dσ/dΩ of reflected electrons decreases with increasing scattering angle θ and the working distance h and is directly proportional to the difference potential Δφ and the energy of incident electrons η. Distort the electron mirror images with increased Δφ.

Paper Details

Date Published: 23 January 2015
PDF: 14 pages
J. Nanophoton. 9(1) 093096 doi: 10.1117/1.JNP.9.093096
Published in: Journal of Nanophotonics Volume 9, Issue 1
Show Author Affiliations
Younis Mohamed Atiah Al-zahy, Misan Univ. (Iraq)


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