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Journal of Nanophotonics • Open Access

Electro-optical study of nanoscale Al-Si-truncated conical photodetector with subwavelength aperture
Author(s): Matityahu Karelits; Ya'akov M. Mandelbaum; Avraham R. Chelly; Avi Karsenty

Paper Abstract

A type of silicon photodiode has been designed and simulated to probe the optical near field and detect evanescent waves. These waves convey subwavelength resolution. This photodiode consists of a truncated conical shaped, silicon Schottky diode having a subwavelength aperture of 150 nm. Electrical and electro-optical simulations have been conducted. These results are promising toward the fabrication of a new generation of photodetector devices.

Paper Details

Date Published: 19 December 2017
PDF: 13 pages
J. Nanophoton. 11(4) 046021 doi: 10.1117/1.JNP.11.046021
Published in: Journal of Nanophotonics Volume 11, Issue 4
Show Author Affiliations
Matityahu Karelits, Jerusalem College of Technology (Israel)
Ya'akov M. Mandelbaum, Jerusalem College of Technology (Israel)
Avraham R. Chelly, Bar-Ilan Univ. (Israel)
Avi Karsenty, Jerusalem College of Technology (Israel)

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