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Journal of Micro/Nanolithography, MEMS, and MOEMS

Volume refractometry of liquids using stable optofluidic Fabry–Pérot resonator with curved surfaces
Author(s): Noha Ali Aboulela Gaber; Yuto Takemura; Frédéric Marty; Diaa A. M. Khalil; Dan Angelescu; Elodie Richalot; Tarik Bourouina
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Paper Abstract

This work reports a simple, miniaturized optical sensing module for liquid refractometry. It is based on a stable Fabry–Pérot resonator consisting of two silicon cylindrical mirrors with a cylindrical lens in between. The lens is formed by a capillary tube through which the analyte passes. This setup enables volume refractometry, where light propagates through the sample realizing high-interaction depth. The cylindrical surfaces achieve light confinement, reducing the light escaping loss encountered in classical cavities with straight mirrors; hence, a high-quality factor (Q) over 1000 is attained. Exploiting this high Q, we adopt the refractive index (RI) measurement criterion: operating at a fixed wavelength and detecting the power drop as a consequence to the spectral shift with RI change. This technique showed that measuring RI change Δn above the RI of the reference solution can be determined for 0.0023<Δn<0.0045. Sensitivity up to 4094  dBm/RIU is achieved. A wider range is still achievable by the conventional method of tracing the shift in peak wavelengths: a range of Δn=0.0163  RIU can be scanned, with a sensitivity of 221  nm/RIU. Error analysis has been accomplished, and the device’s design parameters are discussed to evaluate the performance.

Paper Details

Date Published: 28 October 2015
PDF: 6 pages
J. Micro/Nanolith. 14(4) 045501 doi: 10.1117/1.JMM.14.4.045501
Published in: Journal of Micro/Nanolithography, MEMS, and MOEMS Volume 14, Issue 4
Show Author Affiliations
Noha Ali Aboulela Gaber, Ecole Supérieure d'Ingénieurs en Électronique et Électrotechnique (France)
Yuto Takemura, Kagawa Univ. (Japan)
Frédéric Marty, ESIEE Paris (France)
Diaa A. M. Khalil, Ain-Shams Univ. (Egypt)
Dan Angelescu, Ecole Supérieure d'Ingénieurs en Électronique et Électrotechnique (France)
Elodie Richalot, Univ. Paris-Est Marne-la-Vallée (France)
Tarik Bourouina, ESIEE Paris (France)

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