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Journal of Micro/Nanolithography, MEMS, and MOEMS

Advanced plasma etch technologies for nanopatterning
Author(s): Rich Wise
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Paper Abstract

Advances in patterning techniques have enabled the extension of immersion lithography from 65/45 nm through 14/10  nm device technologies. A key to this increase in patterning capability has been innovation in the subsequent dry plasma etch processing steps. Multiple exposure techniques, such as litho-etch-litho-etch, sidewall image transfer, line/cut mask, and self-aligned structures, have been implemented to solution required device scaling. Advances in dry plasma etch process control across wafer uniformity and etch selectivity to both masking materials have enabled adoption of vertical devices and thin film scaling for increased device performance at a given pitch. Plasma etch processes, such as trilayer etches, aggressive critical dimension shrink techniques, and the extension of resist trim processes, have increased the attainable device dimensions at a given imaging capability. Precise control of the plasma etch parameters affecting across-design variation, defectivity, profile stability within wafer, within lot, and across tools has been successfully implemented to provide manufacturable patterning technology solutions. IBM has addressed these patterning challenges through an integrated total patterning solutions team to provide seamless and synergistic patterning processes to device and integration internal customers. We will discuss these challenges and the innovative plasma etch solutions pioneered by IBM and our alliance partners.

Paper Details

Date Published: 27 December 2013
PDF: 6 pages
J. Micro/Nanolith. MEMS MOEMS 12(4) 041311 doi: 10.1117/1.JMM.12.4.041311
Published in: Journal of Micro/Nanolithography, MEMS, and MOEMS Volume 12, Issue 4
Show Author Affiliations
Rich Wise, IBM Corp. (United States)

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