Share Email Print
cover

Journal of Electronic Imaging

Fast robust detection of edges in noisy depth images
Author(s): Wei Liu; Xiaogang Chen; Qiang Wu; Jie Yang
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Depth edges play an important role in depth image upsampling. Many recent upsampling methods rely on the prior images of depth edges to preserve sharp depth edges in restored depth images. However, recent depth edge detection methods are not robust against the noise in depth images. Some methods are also too time-consuming. We propose a method to efficiently detect edges in depth images. The proposed method is very simple but very robust against the noise in depth images. It is also fast and has near δ(1) implementation. We apply the proposed method to the existing edge guided depth image upsampling. Experimental results on both simulated and real data show the effeδctiveness of the proposed method.

Paper Details

Date Published: 6 September 2016
PDF: 10 pages
J. Electron. Imag. 25(5) 053003 doi: 10.1117/1.JEI.25.5.053003
Published in: Journal of Electronic Imaging Volume 25, Issue 5
Show Author Affiliations
Wei Liu, Shanghai Jiao Tong Univ. (China)
Xiaogang Chen, Univ. of Shanghai for Science and Technology (China)
Qiang Wu, Univ. of Technology, Sydney (Australia)
Jie Yang, Shanghai Jiao Tong Univ. (China)


© SPIE. Terms of Use
Back to Top