Share Email Print
cover

Journal of Electronic Imaging

Partial least-squares regression on common feature space for single image superresolution
Author(s): Songze Tang; Liang Xiao; Pengfei Liu; Huicong Wu
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We proposed a superresolution (SR) method based on example-learning framework. In our framework, the relationship between the output high-resolution (HR) estimation and the HR training images is approximated by the relationship between the low-resolution (LR) test image and the HR training images. To effectively capture the strong correlation between LR and HR images, the LR and HR images are mapped onto a common feature space. Furthermore, in order to maintain their original two-dimensional (2-D) spatial structure, the original LR and HR patches are mapped onto the underlying common feature space using 2-D canonical correlation analysis. Later, the relationship between HR and LR features is established by partial least squares (PLS) with low regression errors on the derived feature space. In addition, a steering kernel regression (SKR) constraint is integrated into patch aggregation to improve the quality of the recovered images. Finally, the effectiveness of our approach is validated by extensive experimental comparisons with several SR algorithms for the natural image superresolution both quantitatively and qualitatively.

Paper Details

Date Published: 18 September 2014
PDF: 12 pages
J. Electron. Imaging. 23(5) 053006 doi: 10.1117/1.JEI.23.5.053006
Published in: Journal of Electronic Imaging Volume 23, Issue 5
Show Author Affiliations
Songze Tang, Nanjing Univ. of Science and Technology (China)
Liang Xiao, Nanjing Univ. of Science and Technology (China)
Jiangsu Province Key Lab. of Spectral Imaging and Intelligent Sensing (China)
Pengfei Liu, Nanjing Univ. of Science and Technology (China)
Huicong Wu, Nanjing Univ. of Science and Technology (China)


© SPIE. Terms of Use
Back to Top