Share Email Print

Journal of Electronic Imaging

Linear dimensionality reduction applied to scale invariant feature transformation and speeded up robust feature descriptors
Author(s): Ricardo Eugenio González Valenzuela; William R. Schwartz; Helio Pedrini
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Robust local descriptors usually consist of high-dimensional feature vectors to describe distinctive characteristics of images. The high dimensionality of a feature vector incurs considerable costs in terms of computational time and storage. It also results in the curse of dimensionality that affects the performance of several tasks that use feature vectors, such as matching, retrieval, and classification of images. To address these problems, it is possible to employ some dimensionality reduction techniques, leading frequently to information lost and, consequently, accuracy reduction. This work aims at applying linear dimensionality reduction to the scale invariant feature transformation and speeded up robust feature descriptors. The objective is to demonstrate that even risking the decrease of the accuracy of the feature vectors, it results in a satisfactory trade-off between computational time and storage requirements. We perform linear dimensionality reduction through random projections, principal component analysis, linear discriminant analysis, and partial least squares in order to create lower dimensional feature vectors. These new reduced descriptors lead us to less computational time and memory storage requirements, even improving accuracy in some cases. We evaluate reduced feature vectors in a matching application, as well as their distinctiveness in image retrieval. Finally, we assess the computational time and storage requirements by comparing the original and the reduced feature vectors.

Paper Details

Date Published: 24 June 2014
PDF: 13 pages
J. Electron. Imag. 23(3) 033017 doi: 10.1117/1.JEI.23.3.033017
Published in: Journal of Electronic Imaging Volume 23, Issue 3
Show Author Affiliations
Ricardo Eugenio González Valenzuela, Univ. Estadual de Campinas (Brazil)
William R. Schwartz, UFMG (Brazil)
Helio Pedrini, Univ. Estadual de Campinas (Brazil)

© SPIE. Terms of Use
Back to Top