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Journal of Electronic Imaging • Open Access

Single-image superresolution based on local regression and nonlocal self-similarity
Author(s): Jing Hu; Yupin Luo

Paper Abstract

The challenge of learning-based superresolution (SR) is to predict the relationships between low-resolution (LR) patches and their corresponding high-resolution (HR) patches. By learning such relationships from external training images, the existing learning-based SR approaches are often affected by the relevance between the training data and the LR input image. Therefore, we propose a single-image SR method that learns the LR-HR relations from the given LR image itself instead of any external images. Both the local regression model and nonlocal patch redundancy are exploited in the proposed method. The local regression model is employed to derive the mapping functions between self-LR-HR example patches, and the nonlocal self-similarity gives rise to a high-order derivative estimation of the derived mapping function. Moreover, to fully exploit the multiscale similarities inside the LR input image, we accumulate the previous reconstruction results and their corresponding LR versions as additional example patches for the subsequent estimation process, and adopt a gradual magnification scheme to achieve the desired zooming size step by step. Extensive experiments on benchmark images have validated the effectiveness of the proposed method. Compared to other state-of-the-art SR approaches, the proposed method provides photorealistic HR images with sharp edges.

Paper Details

Date Published: 16 June 2014
PDF: 14 pages
J. Electron. Imag. 23(3) 033014 doi: 10.1117/1.JEI.23.3.033014
Published in: Journal of Electronic Imaging Volume 23, Issue 3
Show Author Affiliations
Jing Hu, Tsinghua Univ. (China)
Yupin Luo, Tsinghua Univ. (China)

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