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Journal of Electronic Imaging

Geometric calibration of line-scan camera using a planar pattern
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Paper Abstract

We present an innovative calibration method for line-scan cameras to estimate the intrinsic parameters. The calibration involves using a stationary planar pattern that consists of repeated vertical and slanted lines, and constructing a two-dimensional (2-D) calibration framework with one-dimensional (1-D) data. A feature point reconstruction method is applied to transform the 1-D camera calibration problem into the 2-D scope. Camera parameters are then solved by using a 2-D camera model with constraints unique to 1-D geometry. In our tests over 12 calibrations with images of 2048×2048  pixels , the average of the reprojection errors is 0.46 pixels. As opposed to other line-scan camera calibration techniques, this method does not require the camera to progressively scan a pattern, thus eliminating the need for additional mechanical devices to assist the calibration. This method does not need a three-dimensional pattern as a calibration target, either. The stationary planar target makes the calibration more suitable for an application that has to be done in a nonlaboratory setting, such as highway pavement inspection.

Paper Details

Date Published: 21 February 2014
PDF: 9 pages
J. Electron. Imag. 23(1) 013028 doi: 10.1117/1.JEI.23.1.013028
Published in: Journal of Electronic Imaging Volume 23, Issue 1
Show Author Affiliations
Ming Yao, The Univ. of Texas at Austin (United States)
Zuyun Zhao, The Univ. of Texas at Austin (United States)
Bugao Xu, The Univ. of Texas at Austin (United States)

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