Share Email Print

Journal of Electronic Imaging

Interpolation scheme based on the Bayes classifier
Author(s): Sang-Jun Park; Gwanggil Jeon; Jiaji Wu; Jechang Jeong
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Our purpose is to present an intrafield deinterlacing method using the Bayes classifier. The conventional intrafield deinterlacing methods interpolate the pixel along the local edge direction, but they yield interpolation errors when the local edge direction is determined to be wrong. On the basis of the Bayes classifier, the proposed algorithm performs region-based deinterlacing. The proposed algorithm utilizes an input feature vector that includes five directional correlations, which are used to extract the characteristics of the local region, to classify the local region. After the classification of the local region, one of the three simple interpolation methods, which possesses the highest probability to be used among the three, is chosen for the corresponding local region. In addition, we categorized the range of the feature vector to reduce the computational complexity. Simulation results show that the proposed Bayes classifier-based deinterlacing method minimizes interpolation errors. Compared to the traditional deinterlacing methods and Wiener filter-based interpolation method, the proposed method improves the subjective quality of the reconstructed image, and maintains a higher peak signal-to-noise ratio level.

Paper Details

Date Published: 10 April 2013
PDF: 10 pages
J. Electron. Imag. 22(2) 023003 doi: 10.1117/1.JEI.22.2.023003
Published in: Journal of Electronic Imaging Volume 22, Issue 2
Show Author Affiliations
Sang-Jun Park, Hyundai Mobis Co., Ltd. (Korea, Republic of)
Gwanggil Jeon, Incheon National Univ. (Korea, Republic of)
Jiaji Wu, Xidian Univ. (China)
Jechang Jeong, Hanyang Univ. (Korea, Republic of)

© SPIE. Terms of Use
Back to Top