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Journal of Electronic Imaging • Open Access

Errata: Haar-like compact local binary pattern for illumination-robust feature matching
Author(s): Bongjoe Kim; Jihoon Choi; Sanghyun Joo; Kwanghoon Sohn

Paper Abstract

This article [J. Electron. Imaging. 21, (4 ), 043014 (2012)] was originally published online on 22 November 2012 with errors in two author affiliations. Conference Presentation Video Visit SPIE.TV Author affiliations of Sanghyun Joo and Kwanghoon Sohn were erroneously listed as Yonsei University, Department of Electrical and Electronic Engineering, 134 Shinchon-dong, Seodaemun-gu, Seoul 120-749, Republic of Korea. Both authors are actually affiliated with Agency for Defense Development, Daejeon 305-152, Republic of Korea, as listed above. Conference Presentation Video Visit SPIE.TV All online versions of the article were corrected on 11 December 2012.

Paper Details

Date Published: 13 December 2012
PDF: 2 pages
J. Electron. Imag. 21(4) 049801 doi: 10.1117/1.JEI.21.4.049801
Published in: Journal of Electronic Imaging Volume 21, Issue 4
Show Author Affiliations
Bongjoe Kim, Yonsei Univ. (Korea, Republic of)
Jihoon Choi, Agency for Defense Development (Korea, Republic of)
Sanghyun Joo, Agency for Defense Development (Korea, Republic of)
Kwanghoon Sohn, Yonsei Univ. (Korea, Republic of)

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