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Journal of Electronic Imaging

Novel, fast, edge-directed image reconstruction algorithm using a substepping system for critical-dimension measurement of glass panels
Author(s): Nam Thai Doan; Jun-Hee Moon; Tai-Wook Kim; Heui Jae Pahk
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Paper Abstract

We report a system for performing critical-dimension (CD) measurements of glass panels that uses a substepping system to generate a sequence of lower-resolution images and a fast, edge-directed image reconstruction algorithm to combine these images into a higher-resolution image. A large working distance and large aperture of microscope objective is required in glass panel manufacturing, to measure very small distances at high-level repeatability in a short time, which in turn allows only low magnification objectives. Low-resolution images are obtained when the camera of the CD measurement system is moved at step intervals smaller than the normal pixel size of the camera sensor. We propose a fast, edge-directed image registration (IR) algorithm to find the subpixel accuracy information for full-size images to be registered. The number of processed pixels is only about 5% to 10% of the number of pixels in the image, and the algorithm runs noniteratively. Thus, the subpixel IR algorithm is faster than other methods. In addition, a weighting calculation method for fast and robust edge-directed image interpolation algorithm is proposed to form a high-resolution image. Our experimental results prove that the proposed method offers faster processing time than the standard process and acceptable repeatability of CD measurements.

Paper Details

Date Published: 14 September 2012
PDF: 9 pages
J. Electron. Imag. 21(3) 033028 doi: 10.1117/1.JEI.21.3.033028
Published in: Journal of Electronic Imaging Volume 21, Issue 3
Show Author Affiliations
Nam Thai Doan, Seoul National Univ. (Korea, Republic of)
Jun-Hee Moon, Yuhan College (Korea, Republic of)
Tai-Wook Kim, Seoul National Univ. (Korea, Republic of)
Heui Jae Pahk, Seoul National Univ. (Korea, Republic of)

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