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Journal of Electronic Imaging

Defect detection on images using multiple reference images: solving a binary labeling problem using graph-cuts algorithm
Author(s): Janghee Lee; Suk In Yoo
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Paper Abstract

We present a new formulation to solve a defect detection problem on images using multiple reference images. The reference images are defect-free images obtained from the same position of other products. The defect detection problem is reformulated as a binary labeling problem, where each pixel is labeled with "one" if it contains a defect and with "zero" otherwise. The formulation of the energy function used for the labeling problem is defined. Then, the graph-cuts algorithm is used to obtain the optimal label set minimizing the energy function that becomes the defect detection result. The presented approaches are robust to noises taken from several sources, including image-taking, transmission process, environmental lighting, and pattern variation. It does not suffer from the alignment problem for the conventional comparison methods using references. These approaches are illustrated with real data sets, semiconductor wafer images collected by scanning electron microscope equipment, and compared to other defect detection approach.

Paper Details

Date Published: 14 September 2012
PDF: 11 pages
J. Electron. Imaging. 21(3) 033014 doi: 10.1117/1.JEI.21.3.033014
Published in: Journal of Electronic Imaging Volume 21, Issue 3
Show Author Affiliations
Janghee Lee, Seoul National Univ. (Korea, Republic of)
Suk In Yoo, Seoul National Univ. (Korea, Republic of)


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