Share Email Print
cover

Journal of Electronic Imaging

Iterative normalization method for improved prostate cancer localization with multispectral magnetic resonance imaging
Author(s): Xin Liu; Imam Samil Yetik
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Use of multispectral magnetic resonance imaging has received a great interest for prostate cancer localization in research and clinical studies. Manual extraction of prostate tumors from multispectral magnetic resonance imaging is inefficient and subjective, while automated segmentation is objective and reproducible. For supervised, automated segmentation approaches, learning is essential to obtain the information from training dataset. However, in this procedure, all patients are assumed to have similar properties for the tumor and normal tissues, and the segmentation performance suffers since the variations across patients are ignored. To conquer this difficulty, we propose a new iterative normalization method based on relative intensity values of tumor and normal tissues to normalize multispectral magnetic resonance images and improve segmentation performance. The idea of relative intensity mimics the manual segmentation performed by human readers, who compare the contrast between regions without knowing the actual intensity values. We compare the segmentation performance of the proposed method with that of z-score normalization followed by support vector machine, local active contours, and fuzzy Markov random field. Our experimental results demonstrate that our method outperforms the three other state-of-the-art algorithms, and was found to have specificity of 0.73, sensitivity of 0.69, and accuracy of 0.79, significantly better than alternative methods.

Paper Details

Date Published: 17 May 2012
PDF: 13 pages
J. Electron. Imaging. 21(2) 023008 doi: 10.1117/1.JEI.21.2.023008
Published in: Journal of Electronic Imaging Volume 21, Issue 2
Show Author Affiliations
Xin Liu, Illinois Institute of Technology (United States)
Imam Samil Yetik, Illinois Institute of Technology (United States)


© SPIE. Terms of Use
Back to Top