Share Email Print

Journal of Astronomical Telescopes, Instruments, and Systems

Speedster-EXD: a new event-driven hybrid CMOS x-ray detector
Author(s): Christopher V. Griffith; Abraham D. Falcone; Zachary R. Prieskorn; David N. Burrows
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Speedster-EXD is a new 64×64  pixel2, 40-μm  pixel pitch, 100-μm depletion depth hybrid CMOS x-ray detector with the capability of reading out only those pixels containing event charge, thus enabling fast effective frame rates. A global charge threshold can be specified, and pixels containing charge above this threshold are flagged and read out. The Speedster detector has also been designed with other advanced in-pixel features to improve performance, including a low-noise, high-gain capacitive transimpedance amplifier that eliminates interpixel capacitance crosstalk (IPC), and in-pixel correlated double sampling subtraction to reduce reset noise. We measure the best energy resolution on the Speedster-EXD detector to be 206 eV (3.5%) at 5.89 keV and 172 eV (10.0%) at 1.49 keV. The average IPC to the four adjacent pixels is measured to be 0.25%±0.2% (i.e., consistent with zero). The pixel-to-pixel gain variation is measured to be 0.80%±0.03%, and a Monte Carlo simulation is applied to better characterize the contributions to the energy resolution.

Paper Details

Date Published: 7 January 2016
PDF: 13 pages
J. Astron. Telesc. Instrum. Syst. 2(1) 016001 doi: 10.1117/1.JATIS.2.1.016001
Published in: Journal of Astronomical Telescopes, Instruments, and Systems Volume 2, Issue 1
Show Author Affiliations
Christopher V. Griffith, The Pennsylvania State Univ. (United States)
Abraham D. Falcone, The Pennsylvania State Univ. (United States)
Zachary R. Prieskorn, The Pennsylvania State Univ. (United States)
David N. Burrows, The Pennsylvania State Univ. (United States)

© SPIE. Terms of Use
Back to Top