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Journal of Astronomical Telescopes, Instruments, and Systems • Open Access

Analysis of electron multiplying charge coupled device and scientific CMOS readout noise models for Shack–Hartmann wavefront sensor accuracy
Author(s): Alastair G. Basden

Paper Abstract

In recent years, detectors with subelectron readout noise have been used very effectively in astronomical adaptive optics systems. Here, we compare readout noise models for the two key faint flux level detector technologies that are commonly used: electron multiplying charge coupled device (EMCCD) and scientific CMOS (sCMOS) detectors. We find that in almost all situations, EMCCD technology is advantageous, and that the commonly used simplified model for EMCCD readout is appropriate. We also find that the commonly used simple models for sCMOS readout noise are optimistic, and we recommend that a proper treatment of the sCMOS root mean square readout noise probability distribution should be considered during instrument performance modeling and development.

Paper Details

Date Published: 27 July 2015
PDF: 10 pages
J. Ast. Inst. Sys. 1(3) 039002 doi: 10.1117/1.JATIS.1.3.039002
Published in: Journal of Astronomical Telescopes, Instruments, and Systems Volume 1, Issue 3
Show Author Affiliations
Alastair G. Basden, Durham Univ. (United Kingdom)


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