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Optical Engineering

Method for the deviation inspection of integrated circuit chip pin based on Harr wavelet transform
Author(s): Gang Luo; Hui Fang; ZhiLiang Fang; Guoguang Mu
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Paper Details

Date Published: 1 June 2000
PDF: 5 pages
Opt. Eng. 39(6) doi: 10.1117/1.602549
Published in: Optical Engineering Volume 39, Issue 6
Show Author Affiliations
Gang Luo, Nanyang Technological Univ. (Singapore)
Hui Fang, Nankai Univ. (China)
ZhiLiang Fang, Nankai Univ. (China)
Guoguang Mu, Nankai Univ. (China)

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