Share Email Print

Optical Engineering

High reflectivity measurements using the beat frequency of longitudinal modes of external cavity semiconductor lasers
Author(s): J. Eom; Chin B. Su
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 June 2000
PDF: 4 pages
Opt. Eng. 39(6) doi: 10.1117/1.602533
Published in: Optical Engineering Volume 39, Issue 6
Show Author Affiliations
J. Eom, Texas A&M Univ. (United States)
Chin B. Su, Texas A&M Univ. (United States)

© SPIE. Terms of Use
Back to Top