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Optical Engineering

High reflectivity measurements using the beat frequency of longitudinal modes of external cavity semiconductor lasers
Author(s): J. Eom; Chin B. Su
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Paper Abstract

The longitudinal mode spacing of an external cavity semiconductor laser is dramatically reduced if a high-reflectivity etalon is inserted in the external cavity. By measuring the reduction in the longitudinal mode beat frequency using a microwave spectrum analyzer, a quick and precise method for determining the coating reflectivity is demonstrated.

Paper Details

Date Published: 1 June 2000
PDF: 4 pages
Opt. Eng. 39(6) doi: 10.1117/1.602533
Published in: Optical Engineering Volume 39, Issue 6
Show Author Affiliations
J. Eom, Texas A&M Univ. (United States)
Chin B. Su, Texas A&M Univ. (United States)


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