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Optical Engineering

Multiwavelength fringe scanning profilometry for wide gapped sample
Author(s): Minghong Tsai; Hongxin Huang; Masahide Itoh; Toyohiko Yatagai
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Paper Details

Date Published: 1 April 2000
PDF: 8 pages
Opt. Eng. 39(4) doi: 10.1117/1.602456
Published in: Optical Engineering Volume 39, Issue 4
Show Author Affiliations
Minghong Tsai, Univ. of Tsukuba (Japan)
Hongxin Huang, Univ. of Tsukuba (Japan)
Masahide Itoh, Univ. of Tsukuba (Japan)
Toyohiko Yatagai, Univ. of Tsukuba (Japan)

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