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Optical Engineering

Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms
Author(s): Min-Cheol Park; Seung-Woo Kim
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Paper Abstract

We present a new computational method of white light scanning interferometry for 3-D surface mapping. This method accomplishes the task of detecting the true peak of the interference fringe in two steps. The first step is global search locating the envelope peak by fitting sampled intensity data directly to a symmetric quadratic polynomial. The second step is fine-tuning to precisely determine the fringe peak by compensating for the phase shift on reflection using the absolute fringe order identified by the envelope peak obtained in the first step. This two-step method offers an efficient means of computation to provide a good measuring accuracy with high noise immunity owing to its inherent reliance on least squares principles.

Paper Details

Date Published: 1 April 2000
PDF: 8 pages
Opt. Eng. 39(4) doi: 10.1117/1.602445
Published in: Optical Engineering Volume 39, Issue 4
Show Author Affiliations
Min-Cheol Park, KAIST (United States)
Seung-Woo Kim, Korea Advanced Institute of Science and Technology (South Korea)

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