Share Email Print

Optical Engineering

Interphase in plasma-deposited silicon nitride optical films on polycarbonate: in situ ellipsometric characterization
Author(s): Adam Bergeron; Daniel Poitras; Ludvik Martinu
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Plasma-enhanced chemical vapor deposition is very attractive for the fabrication of optical filters on plastic substrates. We found, using ex situ and in situ spectroellipsometric analysis, that plasma deposition of silicon nitride as a high-refractive-index material, on bare and plasma-pretreated polycarbonate (PC) substrates, gives rise to the formation of a 50- to 100-nm-thick interfacial region (or interphase). We show that plasma pretreatment can reduce the thickness of this interphase by 50% from that obtained with deposition on untreated PC, possibly due to interface stabilization. An optical model based on real-time in situ measurements is proposed to describe the interphase refractive index profile. This model is fully supported by complementary crosssectional transmission-electron-microscopy observations. Important consequences for the mechanical performance (adhesion and scratch resistance) and optical design of optical coatings on plastics are discussed.

Paper Details

Date Published: 1 March 2000
PDF: 7 pages
Opt. Eng. 39(3) doi: 10.1117/1.602433
Published in: Optical Engineering Volume 39, Issue 3
Show Author Affiliations
Adam Bergeron, Optical Coating Laboratory, Inc. (OCLI) (United States)
Daniel Poitras, Ecole Polytechnique de Montreal (Canada)
Ludvik Martinu, Ecole Polytechnique de Montreal (Canada)

© SPIE. Terms of Use
Back to Top