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Optical Engineering

Interphase in plasma-deposited silicon nitride optical films on polycarbonate: in situ ellipsometric characterization
Author(s): Adam Bergeron; Daniel Poitras; Ludvik Martinu
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Paper Details

Date Published: 1 March 2000
PDF: 7 pages
Opt. Eng. 39(3) doi: 10.1117/1.602433
Published in: Optical Engineering Volume 39, Issue 3
Show Author Affiliations
Adam Bergeron, Optical Coating Laboratory, Inc. (OCLI) (United States)
Daniel Poitras, Ecole Polytechnique de Montreal (Canada)
Ludvik Martinu, Ecole Polytechnique de Montreal (Canada)


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