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Optical Engineering

Extension of the displacement measurement range for electronic speckle-shearing pattern interferometry using carrier fringes and a temporal-phase-unwrapping method
Author(s): Rene A. Martinez-Celorio; Abundio Davila; Guillermo H. Kaufmann; Gabriel Mendiola
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Paper Details

Date Published: 1 March 2000
PDF: 7 pages
Opt. Eng. 39(3) doi: 10.1117/1.602423
Published in: Optical Engineering Volume 39, Issue 3
Show Author Affiliations
Rene A. Martinez-Celorio, Centro de Investigaciones en Optica (Mexico)
Abundio Davila, Ctr. de Investigaciones en Optica, AC (Mexico)
Guillermo H. Kaufmann, Univ. Nacional de Rosario (Argentina)
Gabriel Mendiola, Centro Investigaciones Optica (Mexico)

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