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Optical Engineering

Extension of the displacement measurement range for electronic speckle-shearing pattern interferometry using carrier fringes and a temporal-phase-unwrapping method
Author(s): Rene A. Martinez-Celorio; Abundio Davila; Guillermo H. Kaufmann; Gabriel Mendiola
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Paper Abstract

A technique for increasing the displacement measurement range in electronic speckle-shearing pattern interferometry is proposed. The technique is based on the introduction of carrier fringes and the use of a temporal-phase-unwrapping method to obtain larger measuring ranges of out-of-plane displacements of an object without sign ambiguities. A larger measuring range is obtained by dividing the desired maximum-phase range into several subranges where the spatial synchronous detection method can be successfully applied. These phase subranges correspond to small out-of-plane displacements of the object, and a speckle pattern is recorded for each displacement. The carrier fringes are obtained by the subtraction correlation of two consecutive speckle fields with a translation of the illuminating beam between recordings. The method allows the measurement of object displacements of about 216 ?m.

Paper Details

Date Published: 1 March 2000
PDF: 7 pages
Opt. Eng. 39(3) doi: 10.1117/1.602423
Published in: Optical Engineering Volume 39, Issue 3
Show Author Affiliations
Rene A. Martinez-Celorio, Centro de Investigaciones en Optica (Mexico)
Abundio Davila, Ctr. de Investigaciones en Optica, AC (Mexico)
Guillermo H. Kaufmann, Univ. Nacional de Rosario (Argentina)
Gabriel Mendiola, Centro Investigaciones Optica (Mexico)

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