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Optical Engineering

Scattering loss measurements of evaporated slab waveguides of SiO2 and NdF3 using a prism coupler and angle-limited integrated scattering
Author(s): Juan Bautista Hurtado-Ramos; Orestes Nicholas Stavroudis; G. Gomez-Rosas; Haiming Wang
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Paper Abstract

A method for finding the attenuation coefficient of a planar or channel waveguide is described. Results for SiO2 and NdF3 waveguides were obtained, showing that the latter presents better attenuation characteristics. The influence of the prism shape on the measurements was also tested and found to result in variations in the measured attenuation coefficient. Two different locations of the waveguides were selected for the coupling, and again variations occurred, suggesting irregular thickness of the thin films. The method uses concepts based on the angle- limited integrated scattering technique and also on the well-known prism coupling method. It may be possible to make the system fully automatic.

Paper Details

Date Published: 1 February 2000
PDF: 7 pages
Opt. Eng. 39(2) doi: 10.1117/1.602395
Published in: Optical Engineering Volume 39, Issue 2
Show Author Affiliations
Juan Bautista Hurtado-Ramos, Centro de Investigaciones en Optica (Mexico)
Orestes Nicholas Stavroudis, Centro de Investigaciones en Optica (United States)
G. Gomez-Rosas, Ctr. de Investigaciones en Optica, A.C. (Mexico)
Haiming Wang, Centro de Investigaciones en Optica, AC (United States)

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