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Optical Engineering

Precision calibration and systematic error reduction in the long trace profiler
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Paper Details

Date Published: 1 January 2000
PDF: 7 pages
Opt. Eng. 39(1) doi: 10.1117/1.602364
Published in: Optical Engineering Volume 39, Issue 1
Show Author Affiliations
Shinan Qian, Brookhaven National Lab. (United States)
Giovanni Sostero, Sincrotrone Trieste (Italy)
Peter Z. Takacs, Brookhaven National Lab. (United States)

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